ASHISH BANSAL. Faster Model Improvements through Weakly Supervised Labels. International Journal of Intelligent Systems and Applications in Engineering, [S. l.], v. 12, n. 4, p. 4806–4810, 2024. Disponível em: https://www.ijisae.org/index.php/IJISAE/article/view/7186. Acesso em: 30 sep. 2025.