HAMEED UL HASSAN MOHAMMED. Design for Testability (DFT) Techniques in Modern VLSI Chips . International Journal of Intelligent Systems and Applications in Engineering, [S. l.], v. 7, n. 4, p. 285 –, 2019. Disponível em: https://www.ijisae.org/index.php/IJISAE/article/view/7808. Acesso em: 26 sep. 2025.